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  • 1 University of Applied Sciences Offenburg Badstrasse 24 D-77652 Offenburg Germany
  • | 2 University of Applied Sciences Gissen/Friedberg Wilhelm-Leuschner-Strasse 13 D-61169 Friedberg Germany
  • | 3 J&M GmbH Robert-Bosch-Strasse 83 D-73431 Aalen Germany
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A new diode-array scanner in combination with a computer-controlled application system meets all the demands of modern HPTLC measurement. Automatic application, simultaneous measurements at different wavelengths, and different linearization models enable appropriate evaluation of all analytical questions. The theory of error propagation recommends quantification at reflectance values smaller than 0.8; this can be verified only by use of diode-array scanning. The same theory also recommends quantification by use of peak height data, because the theory predicts best precision only for peak height evaluation. Diode-array scanning with reflectance monitoring enables appropriate validation in TLC and HPTLC analysis. All these aspects result in substantial improvement of in-situ quantitative densitometric analysis, and simultaneous recording at different wavelengths opens the way for chemometric evaluation, e.g. peak purity monitoring, which improves the accuracy and reliability of HPTLC analysis.

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