Authors:
L. ChandolaBhabha A tomic Research Centre Spectroscopy Division Trombay 400 085 Bombay (India)

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P. KhannaBhabha A tomic Research Centre Spectroscopy Division Trombay 400 085 Bombay (India)

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Abstract  

A wavelength dispersive X-ray fluorescence spectrometric method has been developed for the analysis of thulium oxide to determine the neighbouring rare earth impurities. The sample is taken in oxalate form and the analysis is done on a Philips PW 1220 spectrometer with a LiF (200) crystal. The detection limit for holmium, lutetium and yttrium is 0.002%, for dysprosium and erbium 0.005% and for, ytterbium it is 0.01%. The precision at each concentration of the standards and the theoretical detection limits have been calculated. Intensity correction factors for the line overlaps have been determined.

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Journal of Radionalytical and Nuclear Chemistry
Language English
Size A4
Year of
Foundation
1968
Volumes
per Year
1
Issues
per Year
12
Founder Akadémiai Kiadó
Founder's
Address
H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
Publisher Akadémiai Kiadó
Springer Nature Switzerland AG
Publisher's
Address
H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
CH-6330 Cham, Switzerland Gewerbestrasse 11.
Responsible
Publisher
Chief Executive Officer, Akadémiai Kiadó
ISSN 0236-5731 (Print)
ISSN 1588-2780 (Online)

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