Authors:
R. Collé Rensselaer Polytechnic Institute Department of Chemistry Troy New York (USA)

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I. Preiss Rensselaer Polytechnic Institute Department of Chemistry Troy New York (USA)

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Angela Li-Scholz State University of New York at Albany Department of Physics Albany New York (USA)

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W. Scholz State University of New York at Albany Department of Physics Albany New York (USA)

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Abstract  

A method has been demonstrated in which the emission of characteristic X-rays following impact ionization by electrons of several MeV energy is used for quantitative elemental analysis. Because of the unique properties of MeV electrons with respect to their X-ray production yield and range in solids, the method has comparable sensitivity over a wide range of elements and relatively less stringent sample preparation requirements. By using energy dispersive techniques to detect the X-rays, a simultaneous determination of the weight fraction of the elements in an unknown sample is possible from a procedure based entirely on empirically determined relative X-ray yields. The method was tested by analyzing three standard metal alloy samples obtained from the National Bureau of Standards. Elements reaging from iron (Z=26) to lead (Z=82) with concentrations from 0.06% to 88% were quantitatively determined. In general, good approximate agreement was found wit the reported assays even for the minor constituents.

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Journal of Radionalytical and Nuclear Chemistry
Language English
Size A4
Year of
Foundation
1968
Volumes
per Year
1
Issues
per Year
12
Founder Akadémiai Kiadó
Founder's
Address
H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
Publisher Akadémiai Kiadó
Springer Nature Switzerland AG
Publisher's
Address
H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
CH-6330 Cham, Switzerland Gewerbestrasse 11.
Responsible
Publisher
Chief Executive Officer, Akadémiai Kiadó
ISSN 0236-5731 (Print)
ISSN 1588-2780 (Online)