Measurement of proton-induced prompt low energy photons by high resolution spectrometry: The analysis of noble metals

L. Lackay; D. Gihwala; M. Peisach

doi:10.1007/bf02040148

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Journal of Radioanalytical and Nuclear Chemistry

Volume/Issue:: Volume 151: Issue 1

Measurement of proton-induced prompt low energy photons by high resolution spectrometry: The analysis of noble metals

Authors: L. Lackay¹, D. Gihwala¹, and M. Peisach²

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¹ School of Science Peninsula Technikon P.O. Box 1906 7535 Bellville (South Africa)
² National Accelerator Centre P.O. Box 72 7131 Faure (South Africa)

DOI:: https://doi.org/10.1007/bf02040148

Page Count:: 213–220

Publication Date:: 17 Sep 1991

Online Publication Date:: 13 Aug 2005

Article Category:: Research Article

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Abstract

Using HPGe detectors, the K X-rays and prompt gamma-rays below 200 keV from Ru, Rh, Pd, Ag, Re, Os, Ir, Pt and Au were measured under bombardment with protons from 1.8 to 5.4 MeV. Excitation functions for analytically important gamma-rays were determined. Interference-free sensitivities were calculated and the method was tested by the analysis of standard dental alloys.