Journal of Radioanalytical and Nuclear Chemistry
Volume/Issue:
Volume 158: Issue 2
Accuracy of the emission-transmission method applied in XRF analysis of intermediate thickness samples
Authors: A. Markowicz 1 , N. Haselberger 1 , H. El Hassan 1 , and M. Sewando 1
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  • 1 IAEA Agency's Laboratories A-2444 Seibersdorf (Austria)
  • 2 Academy of Mining and Metallurgy Institute of Physics and Nuclear Techniques Al. Mickiewicza 30 Pl-30-059 Cracow Poland
  • 3 University of Khartoum Department of Physics P.O. Box 321 Khartoum Sudan
  • 4 University of DSM Department of Physics P.O. Box 35063 Dar-Es-Salaam Tanzania
DOI:
https://doi.org/10.1007/bf02047126
Page Count:
409–415
Publication Date:
17 Apr 1992
Online Publication Date:
13 Aug 2005
Article Category:
Research Article
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Abstract  

Problems connected with quantitative EDXRF analysis of intermediate thickness samples are addressed. The first one is a systematic study of the various contributions to the total error of the E-T method. Special attention is also given to the enhancement effect for intermediate thickness samples; in this context both monochromatic and bichromatic approaches are adapted to a known theoretical model.

Cover Journal of Radioanalytical and Nuclear Chemistry
Journal of Radioanalytical and Nuclear Chemistry
Print ISSN:
0236-5731
Online ISSN:
1588-2780

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