Authors:
M. Peisach National Accelerator Centre P. O. Box 72 7131 Faure (South Africa)

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A. Pillay University of the Witwatersrand Chemistry Department Johannesburg (South Africa)

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C. Pineda National Accelerator Centre P. O. Box 72 7131 Faure (South Africa)

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T. Themistocleous University of the Witwatersrand Chemistry Department Johannesburg (South Africa)

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Abstract  

Using 1.0 MeV protons on thick targets of zeolite pellets, aluminium and silicon were determined by PIXE. Results were compared with XRF data. The relative root mean square error was 3.7% and the results of the two methods agreed with a correlation factor of 0.991. PIXE analysis can be carried out on very small samples, while sample preparation involves minimal handling.

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Journal of Radionalytical and Nuclear Chemistry
Language English
Size A4
Year of
Foundation
1968
Volumes
per Year
1
Issues
per Year
12
Founder Akadémiai Kiadó
Founder's
Address
H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
Publisher Akadémiai Kiadó
Springer Nature Switzerland AG
Publisher's
Address
H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
CH-6330 Cham, Switzerland Gewerbestrasse 11.
Responsible
Publisher
Chief Executive Officer, Akadémiai Kiadó
ISSN 0236-5731 (Print)
ISSN 1588-2780 (Online)