A survey is given on the analytical use of X-ray emitting radioisotopes produced by charged particle activation. Thirty-nine proton and deuteron reactions were considered on twentysix elements (34≤Z≤82). Thick target yields and sensitivity estimates are presented. The features and limitations of this method and the scope of non-destructive and destructive determinations are discussed. The main interest of this approach is to open an avenue for trace analysis with simplified data acquisition and reduction.