Authors:
M. Peisach A. E. R. E. Analytical Sciences Division Harwell Nr. Didcot Berkshire (England)

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D. Newton A. E. R. E. Analytical Sciences Division Harwell Nr. Didcot Berkshire (England)

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P. Peck A. E. R. E. Analytical Sciences Division Harwell Nr. Didcot Berkshire (England)

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T. Pierce A. E. R. E. Analytical Sciences Division Harwell Nr. Didcot Berkshire (England)

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Abstract  

X-radiation emitted as a result of charged particle irradiation offers a means of extending the scope of analytical methods based on the measurement of prompt radiation. X-ray yields from a number of pure materials have been examined over a range of particle energies and X-ray measurement applied to the determination of a number of constituents in aluminium alloys. An examination of the distribution of silicon and germanium across an electronic component has been carried out using a small diameter incident ion beam.

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Journal of Radionalytical and Nuclear Chemistry
Language English
Size A4
Year of
Foundation
1968
Volumes
per Year
1
Issues
per Year
12
Founder Akadémiai Kiadó
Founder's
Address
H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
Publisher Akadémiai Kiadó
Springer Nature Switzerland AG
Publisher's
Address
H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
CH-6330 Cham, Switzerland Gewerbestrasse 11.
Responsible
Publisher
Chief Executive Officer, Akadémiai Kiadó
ISSN 0236-5731 (Print)
ISSN 1588-2780 (Online)