Authors:
I. Golicheff Faculté des Sciences d'Orsay Boursier-Thèse au CEA (France)

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Ch. Engelmann CEN/Saclay Département de Recherche et Analyse, Service d'Analyse et d'Etudes en Chimie Nucléaire et Isotopique B. P. No. 2 91190 Gif-sur-Yvette (France)

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Abstract  

The 837 keV resonance is used for the rapid and non-destructive determination of the gradient of fluorine on the surface of metallic samples. The precise yield curve of this resonance for thick target and the experimental sensitivity of the method have been determined. With this method less than 5·10−4 μg·cm−2 fluorine content can be measured. The resolution is of the order of 1000 Å in aluminium and the concentration profiles can be measured to the depth of 1 μm. The time requirement of a surface analysis is 15–30 min, and 2–3 hrs of a gradient measurement. In addition, this method is simpler and more sensitive than the detection of the 1350 keV alpha-particles from the19F(p, αo)16O reaction.

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Journal of Radionalytical and Nuclear Chemistry
Language English
Size A4
Year of
Foundation
1968
Volumes
per Year
1
Issues
per Year
12
Founder Akadémiai Kiadó
Founder's
Address
H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
Publisher Akadémiai Kiadó
Springer Nature Switzerland AG
Publisher's
Address
H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
CH-6330 Cham, Switzerland Gewerbestrasse 11.
Responsible
Publisher
Chief Executive Officer, Akadémiai Kiadó
ISSN 0236-5731 (Print)
ISSN 1588-2780 (Online)