A hardware system employing dynamic Random Access Memory (dRAM) has been designed to make possible the detection of neutrons. One recognised difficulty with dynamic memory devices is the alpha-particle problem. That is alpha-particle contamination
present within the dRAM encapsulating material may interact sufficiently as to corrupt stored data. We essentially utilized the fact that these corruptions,
known as soft errors
, may be induced in dRAMs by the interaction of charged particles with the chip itself as a basis for system function. A preliminary feasibility study has been carried out to use dynamic RAMs as alpha-particle detectors. Our initial system tests provide information upon detection efficiency, soft error reading rate, energy dependence of the soft error rate and the soft error operating bias relationship. These findings highlight the usefulness of such a device in neutron dosimetry, imaging and analysis, by using a neutron converter with a high cross section for the (n,
) capture reaction.