Silica-containing -zirconium phosphate (-ZrSiP) was prepared by the precipitation method. X-ray diffractometry was used to characterize -ZrSiP and to compare it with other -zirconium phosphates (ZrP). A monoclinic cell with parameters of a=0.9038 nm, b=0.529 nm, c=1.4183 nm and =91.76° was identified for -ZrSiP, i.e. silica modifies the original -ZrP structure. The specific surface area of -ZrSiP was found to be two orders of magnitude higher then that of -ZrP.