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  • 1 Yantai University Department of Physics 264005 Yantai P. R. China
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Abstract  

A total reflection X-ray fluorescence (TXRF) analyzer with a special structure is described. Its short X-ray path (about 15 cm) resulted in a high sensitivity, low power consumption and small volume. The structure with double total reflection path is suitable for easy change of exciting source to cover a large element range. The minimum detection limit (MDL) of 6 pg for Co under Cu exciting source and 22 pg for Sr under Mo tube. Some significant works were done, such as the detemination of sulfur content in fuel oils, the non-destructive analysis of an ancient bronze utensil and the regular analysis of tap water.