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  • 1 Université Claude Bernard Lyon-I et IN2P3 Institut de Physique Nucléaire 43, Bd du 11 novembre 1918 69621 Villeurbanne (France)
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Abstract  

Ion-beam surface analysis of light elements such as oxygen and carbon in light matrices (boron in our case) is mainly subject to matrix interferences. Using a telescope detection system we show that (d, p) reaction for carbon and proton backscattering for oxygen are able to lead to concentration profiles on the first microns of bulk boron samples. Data processing is described and analytical results are shown, making evidence of the purification obtained using electronic bombardment furnace. Comparing with other phhsical methods of analysis, limitation and improvements of this procedure are discussed.