We have constructed a new system which could analyze a position distribution of several elements in a sample with 2 dimensional
prompt γ-ray analysis (2D PGA) system using focused neutron beam at JAEA. We aimed that the system could analyze local information
in a sample with a good signal γ-ray from interested elements to noise of background γ-ray ratio. As a result, this system
could determine the position resolution and spatial resolution within 1 mm.