Authors:
D. Beasley University of Surrey Department of Physics, Centre for Nuclear and Radiation Physics, School of Electronics and Physical Sciences Guildford GU2 7XH UK

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N. Spyrou University of Surrey Department of Physics, Centre for Nuclear and Radiation Physics, School of Electronics and Physical Sciences Guildford GU2 7XH UK

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Abstract  

Rapid micron-resolution quantitative elemental mapping is possible at the University of Surrey using a combination of proton induced X-ray emission tomography (PIXE-T) and simultaneous on/off-axis scanning transmission ion microscopy-tomography (STIM-T). A preliminary analysis of hair was performed. However, experimental uncertainties lead to large errors in tomograms and this work focuses on identifying and reducing the sources of error in both tomographic and 2D mapping. The STIM-T counts per pixel are used to normalise the PIXE-T data for charge. However, the geometry of the collimator and the scattering foil affects the detection rate since the loss of protons in the collimator increases as energy loss increases due to scattering. Errors in the PIXE geometric efficiency are greater in mapping when the detector is close to the sample. Moreover when a ‘funny’ filter was used for PIXE-T the uncertainty in the efficiency was found to increase because the sample-filter distance changes during the experiment.

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Journal of Radionalytical and Nuclear Chemistry
Language English
Size A4
Year of
Foundation
1968
Volumes
per Year
1
Issues
per Year
12
Founder Akadémiai Kiadó
Founder's
Address
H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
Publisher Akadémiai Kiadó
Springer Nature Switzerland AG
Publisher's
Address
H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
CH-6330 Cham, Switzerland Gewerbestrasse 11.
Responsible
Publisher
Chief Executive Officer, Akadémiai Kiadó
ISSN 0236-5731 (Print)
ISSN 1588-2780 (Online)