Authors:
P. Kotas Tesla-Research Institute of Radiocommunications 142 21 Prague (Czechoslovakia)

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I. Obrusnik Nuclear Research Institute 250 68 Řež (Czechoslovakia)

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J. Kvitek Czechoslovak Academy of Sciences Institute of Nuclear Physics 250 68 Řež (Czechoslovakia)

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V. Hnatowicz Czechoslovak Academy of Sciences Institute of Nuclear Physics 250 68 Řež (Czechoslovakia)

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Abstract  

Diffusion of impurities is a basic operation in the technology of modern semiconductor devices especially integrated circuits. A knowledge of diffusion parameters such as concentration profile, diffusion depth and diffusion coefficient makes the optimization of a technological process possible. A destructive method of the step-by-step removal of the layers from the silicon single crystal slices irradiated in a nuclear reactor with subsequent determination of impurity contents was used in the diffusion studies of phosphorus, arsenic and gold. Phosphorus was determined by the beta counting of32P after a separation, arsenic and gold were determined by means of a Ge(Li) gamma-ray spectroscopy without any chemical separation. The diffusion of boron was studied by the nondestructive method of the deconvolution of the energy spectrum of prompt alpha radiation from10B(n, α)7Li after thermal neutron irradiation.

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Journal of Radionalytical and Nuclear Chemistry
Language English
Size A4
Year of
Foundation
1968
Volumes
per Year
1
Issues
per Year
12
Founder Akadémiai Kiadó
Founder's
Address
H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
Publisher Akadémiai Kiadó
Springer Nature Switzerland AG
Publisher's
Address
H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
CH-6330 Cham, Switzerland Gewerbestrasse 11.
Responsible
Publisher
Chief Executive Officer, Akadémiai Kiadó
ISSN 0236-5731 (Print)
ISSN 1588-2780 (Online)