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  • 1 Ghent University Institute for Nuclear Sciences Ghent (Belgium)
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Abstract  

A method for the simultaneous determination of 21 elements in high purity silicon was developed by activation analysis. Extraction, ion exchange, distillation and precipitation techniques were used combined with NaI(Tl) and Ge(Li) γ-spectrometry. Attention was paid to the separation time, sensitivity and selectivity of the method.