Ta and W determination by selective XRF energy dispersive analysis

L. Avaldi; L. Confalonieri; M. Milazzo; E. Paltrinieri

doi:10.1007/bf02166718

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Journal of Radioanalytical and Nuclear Chemistry

Volume/Issue:: Volume 86: Issue 4

Ta and W determination by selective XRF energy dispersive analysis

Authors:

L. Avaldi

L. Avaldi
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L. Confalonieri

L. Confalonieri
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M. Milazzo

M. Milazzo
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E. Paltrinieri

E. Paltrinieri
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Pages:: 221–230

Online Publication Date:: 20 Sep 2005

Publication Date:: 17 Jun 1984

Article Category:: Research Article

DOI:: https://doi.org/10.1007/bf02166718

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Abstract

X-ray fluorescence energy dispersive analysis is applied for the determination of Ta and W in sintering compounds. The combination of selective excitation and very simple mathematical procedures permits the determination of the concentrations of the two adjacent elements /Ta and W/ even when the sample contains only few per cent of Ta. Other possible applications are shown.

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Journal of Radioanalytical and Nuclear Chemistry

Print ISSN:: 0236-5731

Online ISSN:: 1588-2780

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Journal of Radionalytical and Nuclear Chemistry
Language	English
Size	A4
Year of Foundation	1968
Volumes per Year	1
Issues per Year	12
Founder	Akadémiai Kiadó
Founder's Address	H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
Publisher	Akadémiai Kiadó Springer Nature Switzerland AG
Publisher's Address	H-1117 Budapest, Hungary 1516 Budapest, PO Box 245. CH-6330 Cham, Switzerland Gewerbestrasse 11.
Responsible Publisher	Chief Executive Officer, Akadémiai Kiadó
ISSN	0236-5731 (Print)
ISSN	1588-2780 (Online)