Journal of Thermal Analysis and Calorimetry
Volume/Issue:
Volume 21: Issue 2
Application of thin-film DTA to amorphous selenium layers
Authors:
J. Przyłuski Institute of General Chemistry and Inorganic Technology Warsaw Technical University ul. Noakowskiego 3 00-664 Warszawa Poland

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J. Płocharski Institute of General Chemistry and Inorganic Technology Warsaw Technical University ul. Noakowskiego 3 00-664 Warszawa Poland

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W. Bujwan Institute of General Chemistry and Inorganic Technology Warsaw Technical University ul. Noakowskiego 3 00-664 Warszawa Poland

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Pages:
235–238
Online Publication Date:
25 Jul 2005
Publication Date:
01 Aug 1981
Article Category:
Research Article
DOI:
https://doi.org/10.1007/bf01914206
Restricted access

A system of evaporated thin-film Ag-Bi thermocouples was used as a differential temperature sensor for DTA measurements. The crystallization of thin amorphous selenium layers was observed by means of this method. The presented method may be useful in studying the thermal transformations of thin films that have different compositions and various applications.

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Cover Journal of Thermal Analysis and Calorimetry
Journal of Thermal Analysis and Calorimetry
Print ISSN:
1388-6150
Online ISSN:
1572-8943

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Journal of Thermal Analysis and Calorimetry
Language English
Size A4
Year of
Foundation		 1969
Volumes
per Year		 1
Issues
per Year		 24
Founder Akadémiai Kiadó
Founder's
Address		 H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
Publisher Akadémiai Kiadó
Springer Nature Switzerland AG
Publisher's
Address		 H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
CH-6330 Cham, Switzerland Gewerbestrasse 11.
Responsible
Publisher		 Chief Executive Officer, Akadémiai Kiadó
ISSN 1388-6150 (Print)
ISSN 1588-2926 (Online)

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