Analysis of very small particles can present problems. This paper describes the application of temperature programmed solid
insertion probe mass spectrometry (TP-SIP-MS), scanning electron microscopy and SEM X-ray microanalysis to the identification
of foreign particles present in an industrial product. The relative advantages and limitations of the techniques are discussed.
It is shown that TP-SIP-MS is a powerful tool for such work and complements the use of more conventional microanalytical methods.