This paper describes recent advances in thermal analysis instrumentation which combine the high resolution imaging capabilities
of the atomic force microscope with physical characterisation by thermal analysis. Images of the surface may be obtained according
to the specimen's thermal conductivity and thermal expansivity differences in addition to the usual topographic relief. Localised
equivalents of modulated temperature differential scanning calorimetry, thermomechanical and dynamic mechanical analysis have
been developed with a spatial resolution of a few micrometres. A form of localised thermogravimetry-evolved gas analysis has
also been demonstrated. The same instrument configuration can be adapted to allow IR microspectrometry at a resolution better
than the optical diffraction limit.