Authors:
Nicolas van Zeebroeck ULB - Solvay Business School, Centre Emile Bernheim (CEB) Av. Roosevelt 21, 1050 Brussels, Belgium Av. Roosevelt 21, 1050 Brussels, Belgium

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Bruno van Pottelsberghe de la Potterie Brussels University (ULB), Solvay Business School, CEB, DULBEA and CEPR Brussels (Belgium) Brussels (Belgium)

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Wook Han ULB - Solvay Business School Brussels (Belgium) Brussels (Belgium)

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Summary  

This paper analyses several issues that arise when measuring technological specialisation with patent data. Three starting choices are required regarding the data source, the statistical measure and the sectoral aggregation level. We show that the measure is highly sensitive to the data source and to the level of sectoral aggregation. The statistical analysis further suggests that the most stable and reliable measures of technological specialization are obtained with patents applied at the EPO, with Gini or C20 as statistical measure and the 4-digits aggregation level of the IPC classification system.

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Scientometrics
Language English
Size B5
Year of
Foundation
1978
Volumes
per Year
1
Issues
per Year
12
Founder Akadémiai Kiadó
Founder's
Address
H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
Publisher Akadémiai Kiadó
Springer Nature Switzerland AG
Publisher's
Address
H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
CH-6330 Cham, Switzerland Gewerbestrasse 11.
Responsible
Publisher
Chief Executive Officer, Akadémiai Kiadó
ISSN 0138-9130 (Print)
ISSN 1588-2861 (Online)