An in-depth empirical analysis of patent citation counts using zero-inflated count data model: The case of KIST

Yong-Gil Lee; Jeong-Dong Lee; Yong-Il Song; Se-Jun Lee

doi:10.1007/s11192-007-0102-z

Jump to Content

Scientometrics

Volume/Issue:: Volume 70: Issue 1

An in-depth empirical analysis of patent citation counts using zero-inflated count data model: The case of KIST

Authors:

Yong-Gil Lee

Yong-Gil Lee Strategic Planning Division, Korea Institute of Science and Technology, P. O. Box 131, Cheongryang, Seoul, 130-650 Korea

Search for other papers by Yong-Gil Lee in
Current site
Google Scholar
PubMed

Jeong-Dong Lee

Jeong-Dong Lee Techno-Economics and Policy Program, Seoul National University, Seoul, South Korea

Search for other papers by Jeong-Dong Lee in
Current site
Google Scholar
PubMed

Yong-Il Song

Yong-Il Song Strategic Planning Division, Korea Institute of Science and Technology, P. O. Box 131, Cheongryang, Seoul, 130-650 Korea

Search for other papers by Yong-Il Song in
Current site
Google Scholar
PubMed

, and

Se-Jun Lee

Se-Jun Lee Technology Innovation Evaluation Bureau, Ministry of Science and Technology, Anyang, South Korea

Search for other papers by Se-Jun Lee in
Current site
Google Scholar
PubMed

View More View Less

Pages:: 27–39

Online Publication Date:: 15 Jan 2007

Publication Date:: 01 Jan 2007

Article Category:: Research Article

DOI:: https://doi.org/10.1007/s11192-007-0102-z

Restricted access

Abstract

Patent citation counts represent an aspect of patent quality and knowledge flow. Especially, citation data of US patents contain most valuable pieces of the information among other patents. This paper identifies the factors affecting patent citation counts using US patents belonging to Korea Institute of Science and Technology (KIST). For patent citation count model, zero-inflated models are announced to handle the excess zero data. For explanatory factors, research team characteristics, invention-specific characteristics, and geographical domain related characteristics are suggested. As results, the size of invention and the degree of dependence upon Japanese technological domain significantly affect patent citation counts of KIST.

Save
Cite
Email this content

Share Link

Copy this link, or click below to email it to a friend
Email this content
or copy the link directly:

https://akjournals.com/abstract/journals/11192/70/1/article-p27.xml
The link was not copied. Your current browser may not support copying via this button.

Link copied successfully

Collapse
Expand

Scientometrics

Print ISSN:: 0138-9130

Online ISSN:: 1588-2861

To see the editorial board, please visit the website of Springer Nature.

Manuscript submission: http://www.editorialmanager.com/scim/

For subscription options, please visit the website of Springer Nature.

Scientometrics
Language	English
Size	B5
Year of Foundation	1978
Volumes per Year	1
Issues per Year	12
Founder	Akadémiai Kiadó
Founder's Address	H-1117 Budapest, Hungary 1516 Budapest, PO Box 245.
Publisher	Akadémiai Kiadó Springer Nature Switzerland AG
Publisher's Address	H-1117 Budapest, Hungary 1516 Budapest, PO Box 245. CH-6330 Cham, Switzerland Gewerbestrasse 11.
Responsible Publisher	Chief Executive Officer, Akadémiai Kiadó
ISSN	0138-9130 (Print)
ISSN	1588-2861 (Online)