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  • 1 University of Alberta Department of Electrical and Computer Engineering 9701 116 Street Edmonton AB T6G 2V4 Canada
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Abstract  

Patents represent the technological or inventive activity and output across different fields, regions, and time. The analysis of information from patents could be used to help focus efforts in research and the economy; however, the roles of the factors that can be extracted from patent records are still not entirely understood. To better understand the impact of these factors on patent value, machine learning techniques such as feature selection and classification are used to analyze patents in a sample industry, nanotechnology. Each nanotechnology patent was represented by a comprehensive set of numerical features that describe inventors, assignees, patent classification, and outgoing references. After careful design that included selection of the most relevant features, selection and optimization of the accuracy of classification models that aimed at finding most valuable (top-performing) patents, we used the generated models to analyze which factors allow to differentiate between the top-performing and the remaining nanotechnology patents. A few interesting findings surface as important such as the past performance of inventors and assignees, and the count of referenced patents.