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  • Author or Editor: G. Baptista x
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Abstract  

A graphical method was developed to relate data from Rutherford backscattering spectrometry to sample characteristics, such as thickness and concentration profiles. The method was then applied to analyze these characteristics of a gold film.

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Abstract  

The accuracy of the quantitative analysis of thick targets by XRF is impaired by effects due to the absorption of X-rays in the matrix associated with the non-uniformity of the X-ray beam and the lack of knowledge of the actual distribution of trace elements in the target. The uncertainty in the elemental mass associated to a definite number X-rays detected is discussed in the paper. A correction factor is derived to account specifically for the effect of the absorption of X-rays and the non-uniformity of the X-ray beam.

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