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  • Author or Editor: J.R. Gao x
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This study was conducted to compare structural development and biochemical accumulation of waxy and non-waxy wheat (NW) caryopses. The caryopses’ microstructure of the waxy wheat (WW) and NW cultivars at different developmental stages were observed under light, fluorescence, and scanning electron microscope. The results were as follows: Compared with NW,WWhad a shorter maturation duration, which was reflected in several following characteristics. Programmed cell death of the pericarp began earlier, and the chlorophyll-containing layer in the pericarp was smaller. Vacuoles in chalazal cells accumulated more tannins at different developmental stages. Starch granules and protein bodies in the endosperm showed a higher accumulation level in developing caryopses, and aleurone cells were larger in size with larger numbers of aleurone grains. An analysis of the element content indicated that the mineral elements Mg, P, K, and Ca exhibited a higher content, while the heavy elements Cr, Cd, and Pb exhibited a lower content in the aleurone layer.

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Thinopyrum intermedium, which has many useful traits, is valuable for wheat breeding. A new wheat-Thinopyrum addition line, SN100109, was developed from the progeny of common wheat cultivar Yannong 15 and Th. intermedium. It was resistant to most races of Blumeria graminis f. sp tritici (Bgt), which caused powdery mildew in wheat, and its reactions were different from the reactions of gene Pm40 and Pm43. Genomic in situ hybridization (GISH) and molecular marker analysis were used to identify the genomic composition of SN100109. GISH results showed that SN100109 was a wheat-Th. intermedium disomic addition line containing one pair of J chromosomes, and the resistance gene was located on the alien additional chromosomes of SN100109. And four molecular markers BE425942, BF482714, Xgdm93 and BV679214 which were assigned to homologous group 2, were specific molecular markers of the additional chromosomes. All the results indicated that SN100109 contained one pair of 2J chromosomes. SN100109 can be used as a novel germplasm source for introducing powdery mildew resistance genes to wheat in breeding programs.

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Stripe rust, caused by Puccinia striiformis Westend. f. sp. tritici Eriks., is a major disease that causes substantial losses to wheat production worldwide. The utilization of effective resistance genes in wheat cultivars is the preferred control of the disease. To study the inheritance of all-stage resistance in spring wheat cultivars Louise, WA008016, Express, Solano, Alturas and Zak from the Pacific Northwest (PNW) of the United States, the six cultivars were crossed with the Chinese susceptible variety Taichung 29. Single-spore isolates of CYR32 and CYR33, the predominant Chinese races of P. striiformis f. sp. tritici, were used to evaluate F1, F2 and BC1 generations for stripe rust resistance under controlled greenhouse conditions. Genetic analysis determined that Louise had one dominant resistance gene to CYR32, temporarily designated as YrLou. WA008016 had two dominant and one recessive resistance genes to CYR32, temporarily designated as YrWA1, YrWA2 and YrWA3, respectively. Express had a single recessive gene that conferred resistance to CYR32, temporarily designated as YrExp3. The two independent dominant genes in Solano conferring resistance to CYR32 were temporarily designated as YrSol1 and YrSol2. Alturas had two recessive genes for resistance to CYR32, temporarily designated as YrAlt1 and YrAlt2. Zak has one dominant gene for resistance to CYR33, temporarily designated as YrZak1. These six cultivars can be important resistance sources in Chinese wheat stripe rust resistance breeding.

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