Authors:S. Hayami, S. Nomiyama, S. Hirose, Y. Yano, S. Osaki, and Y. Maeda
A barium-iron(III) [BaFe(cr-salen)(py)2](ClO4)3 (1) was prepared and an iron(III) complex [Fe(cr-salen)(py)2]ClO4 (2) complex was obtained by removing Ba2+ ion from the barium-iron(III) complexes with guanidinium sulfate. These complexes are in the high-spin state both in the
solid state and in acetonitrile. Single crystals of [BaFe(cr-salen)(MeOH)2]2O(ClO4)4·2MeOH (3) were obtained by slow evaporation of a solution of (2) and Ba(ClO4)2, and the single crystal X-ray structure of (3) was determined: Crystal data for [BaFe(cr-salen)(MeOH)2]4O2(ClO4)4·2MeOH: C25H36N2O17.5Cl2BaFe, are: space group C2/c, Z=8, a=24.79(7) Å, b=16.11(6) Å, c=17.24(6) Å, V=6753(36) Å3, R=0.133, Rw=0.154. The structure of the complex has a one order polymeric chain. An iron atom is located in a cavity of square pyramidal
geometry and bridged by an oxygen atom of μ-oxo. A barium ion is sitted in a quasi-crownether ring and bridged by two perchlorate
Authors:S. Aukkaravittayapun, C. Thanachayanont, T. Theapsiri, W. Veerasai, Y. Sawada, T. Kondo, S. Tokiwa, and T. Nishide
Fluorine-doped tin dioxide
(FTO) films were deposited on silicon wafers by inverted pyrosol technique
using solutions with different doping concentration (F/Sn=0.00, 0.12, 0.75
and 2.50). The physical and electrical properties of the deposited films were
analyzed by SEM, XRF, resistivity measurement by four-point-probe method and
Hall coefficient measurement by van der Pauw method. The electrical properties
showed that the FTO film deposited using the solution with F/Sn=0.75 gave
a lowest resistivity of 3.210–4 ohm
cm. The FTO films were analyzed by temperature programmed desorption (TPD).
Evolved gases from the heated specimens were detected using a quadruple mass
analyzer for mass fragments m/z, 1(H+),
16(O+), 17(OH+ or NH3+),
18(H2O+ or NH4+),
19(F+), 20(HF+), 28(CO+
or N2+), 32(O2+),
and 152(SnO2+). The majority
of evolved gases from all FTO films were water vapor, carbon monoxide and
carbon dioxide. Fluorine (m/z 19) was detected
only in doped films and its intensity was very strong for highly-doped films
at temperature above 400C.
In non-activated glasses, AlPO 4 crystallizes, and in some, also Al 2 O 3 (corundum). The latter is not present when the glass contains iron. Aluminum also forms the sodium aluminate NaAl 11 O17 , and iron is present in the form of the phosphate
phenomenon can be explained by the escape of chlorine accompanying the reaction of CaCl 2 with glass components.
XRD analysis of sinters with the Aa glass showed crystallization AlPO 4 and also sodium aluminate Na Al 11 O17 in glass. As a result
oxides NaLaNb 2 O 7 ·1.6H 2 O [ 15 , 16 ] and NaLaTa 2 O 7 ·1.9H 2 O [ 17 ] but intermediate compounds have never been isolated and characterized.
TG curve and XRD patterns of NaNdTa 2 O 7 ·1.35H 2 O