Authors:W. Ward, H. Martinez, C. Abeyta, A. Morgan, and T. Nelson
Trace239Pu and241Am contamination on a surface whose alpha count is dominated by235U and234U decay has been successfully quantified by counting swipes in external alpha-spectroscopy chambers. The swipe process, however,
is labor intensive and subject to uncertainties in the swiping process as well as degraded spectral resolution due to the
presence of the swipe material. A multichannel instrument for automated in situ measurements of interior and exterior contamination
has been developed which incorporates a rotary table, 13 fixed ion-implanted silicon detectors, and spectroscopy electronics.
Custom software was written to allow alpha-spectrometer to function as a virtual instrument in the LabView environment. This
system gives improved speed and resolution as well as a complete log of the location of areas of high surface contamination,
a feature not practical to obtain by other methods, and one which opens the possibility of long term studies such as Pu outgrowth
evaluation employing the instrument. We present performance data as well as system integration, calibration, control, and
dynamic geometric efficiency calculations related to the design of this and next generation systems.
Authors:Dong-Hyeon Ko, Ki-Won Gyak, and Dong-Pyo Kim
systemintegration and process diversification have greatly enhanced the system performance for continuous-flow chemistry [ 3 ].
Among the microfluidic components, microreaction modules and microseparation units are the major components that can