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- Author or Editor: Chia-wen Wu x
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Abstract
The purpose of this study is to map semiconductor literature by author co-citation analysis in order to highlight major subject specializations in semiconductors and identify authors and their relationships within these specialties and within the field. Forty-six of the most productive authors were included in the sample list. Author samples were gathered from the INSPEC database from 1978 to 1997. The relatively low author co-citation frequencies indicate that there is a low connection among authors who publish in semiconductor journals and big differences among authors' research areas. Six sets of authors with co-citation greater than 100 times are M. Cardona and G. Lucovsky; T. Ito and K. Kobayashi; M. Cardona and G. Abstreiter; A. Y. Cho and H. Morkoc; C. R. Abernathy and W. S. Hobson; H. Morkoc and I. Akasaki. The Pearson correlation coefficient of author co-citation varies widely, i.e., from -0.17 to 0.92. This shows that some authors with high positive correlations are related in certain ways and co-cited, while other authors with high negative correlations may be rarely or never related and co-cited. Cluster analysis and multi-dimensional scaling are employed to create two-dimensional maps of author relationships in the cross-citation networks. It is found that the authors fall fairly clearly into three clusters. The first cluster covers authors in physics and its applications. The authors in the second group are experts in electrical and electronic engineering. The third group includes specialists in materials science. Because of its interdisciplinary nature and diverse subjects, semiconductor literature lacks a strong group of core authors. The field consists of several specialties around a weak center.
Abstract
The purpose of this study is to map semiconductor literature using journal co-citation analysis. The journal sample was gathered from the INSPEC database from 1978 to 1997. In the co-citation analysis, the data compiled were counts of the number of times two journal titles were jointly cited in later publications. It is assumed that the more two journals are cited together, the closer the relationship between them. The journal set used was the 30 most productive journals in the field of semiconductors. Counts of co-citations to the set of semiconductor journals were retrieved from SciSearch database, accessed through Dialog. Cluster analysis and multi-dimensional scaling were employed to create two-dimensional maps of journal relationships in the cross-citation networks. The following results were obtained through this co-citation study: The 30 journals fall fairly clearly into three clusters. The major cluster of journals, containing 17 titles, is in the subject of physics. The second cluster, consisting of 9 journals, includes journals primarily on material science. The remaining cluster represents research areas in the discipline of electrical and electronic engineering. All co-cited journals share similar co-citation profiles, reflected in high positive Pearson correlation. Two hundred and ninety-six pairs (68%) correlate at greater than 0.70. This shows that there is strong relationship between semiconductor journals. Five individual journals in five paired sets with co-citation frequency over 100,000 times include Physical Review B, Condensed Matter; Physical Review Letters; Applied Physics Letters; Journal of Applied Physics; and Solid State Communications.
