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  • Author or Editor: F. Buehler x
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Abstract  

Until recently, the issue of the thermal gradients within TMDSC samples remained mostly a subject of theory and mathematical models — only the phase lag was subject to experimental verification, as this information is readily available from the analysis software of most instruments. There was no method to verify the transient behaviour and temperature gradients within a sample without making costly and intensive modifications to the equipment. Recently, however, a group of researchers were able to experimentally measure thermal profiles as a function of sample thickness with a high-speed, high-resolution infrared camera mounted on the TMDSC cell. Therefore, this paper is dedicated to comparing the predictions of our three-dimensional model with this newly available data.

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