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  • Author or Editor: J. Huber x
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Abstract  

We show that inventive productivity can be described by two variables, Frenquency and Lifetime. For several samples of inventors, we show that the Exponential and Generalized Pareto distributions provide excellent goodness-of-fit to these variables. Furthermore, good fits to these distributions arises naturally from the statistics of exceedance. Thus, a better theoretical foundation and connection to environmental variables is shown for Frequency and Lifetime than has been shown for Lotka's Law.

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Abstract  

It is shown that the instrumental analysis of carbon and oxygen in GaAs, at trace level, can be achieved by irradiation with low energy deuterons and tritons (3 MeV). The experimental sensitivities are 6 ppb/weight for the16O( 1 3 H,n)18F reaction and 25 ppb/weight for the12C( 1 2 H,n)13N reaction. Applications related to the metallurgy of GaAs are described.

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