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Journal of Radioanalytical and Nuclear Chemistry
Authors:
L. Avaldi
,
L. Confalonieri
,
M. Milazzo
, and
E. Paltrinieri
Abstract
X-ray fluorescence energy dispersive analysis is applied for the determination of Ta and W in sintering compounds. The combination of selective excitation and very simple mathematical procedures permits the determination of the concentrations of the two adjacent elements /Ta and W/ even when the sample contains only few per cent of Ta. Other possible applications are shown.
Journal of Radioanalytical and Nuclear Chemistry
Authors:
L. Avaldi
,
L. Confalonieri
,
M. Milazzo
, and
E. Paltrinieri
