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  • Author or Editor: R. Brzoza-Brzezina x
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Abstract  

The computational method for the rapid evaluation of gamma and X-ray spectra observed by semiconductor detectors in radiometric analysis in presented using a simple peak shape function. The computer programme includes a minimizing routine based on the modified Newton-Raphson method giving a minimized vector of the parameters more rapidly than the conventional approach. The spectra of some gamma-ray emitting fission products and X-ray spectra excited by radioisotopes of materials from copper ore processing were studied. It was found that the simple Gaussian peak function gives the results equivalent to the total peak area method.

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