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Journal of Radioanalytical and Nuclear Chemistry
Authors:
Y. Şahin
,
R. Durak
,
Y. Kurucu
, and
S. Erzeneoğlu
Abstract
Two analytical shape functions representing the shapes of 
- and characteristic X-ray photopeak sides obtained with a Ge(Li) detector are described. The photopeak centroid is accurately determined by using these functions. Energy dependence of photopeak tailing at the lower energy side of the photopeaks are obtained by the least-squares fitting method. The present method can be used for the analysis of partly overlapped photopeaks, one side of which is well resolved, with a sufficient accuracy.
