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  • Author or Editor: S. Jayanthakumar x
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Abstract  

14 MeV neutron activation analysis technique is used to estimate thickness of silicon films deposited on glass plates. The elemental barium present in the glass plate was used as an internal monitor. Measured values of film thickness are in agreement within ±5% with the results obtained by weight method.

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Abstract  

Ancient iron objects excavated from five different sites around Nagpur city in Maharashtra State /India/ were cut into small pieces and samples were prepared. Each sample was irradiated with 14 MeV neutrons for 8 min. From the recorded gamma ray spectrum for each sample, the presence of trace elements Cu, Si, Al, Mg and Mn were detected and their mutual ratios of activities were determined. The results show that all the iron objects obtained from five different sites are of the same origin.

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