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  • Author or Editor: T. Themistocleous x
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Abstract  

Using 1.0 MeV protons on thick targets of zeolite pellets, aluminium and silicon were determined by PIXE. Results were compared with XRF data. The relative root mean square error was 3.7% and the results of the two methods agreed with a correlation factor of 0.991. PIXE analysis can be carried out on very small samples, while sample preparation involves minimal handling.

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